Mastering AI Chip Complexity
Explore challenges and solutions in AI chip development
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We will show how specific features in our scattering measurement instruments can help you achieve more accurate photorealistic renderings for key markets such as automotive and general lighting.
We will also explain how to perform spectral characterizations using Synopsys scattering measurements. This is a key parameter for wavelength-dependent materials to make realistic digital twin designs.
Speaker
Marion Gaboriau-Gil
Senior Application Engineer
Synopsys
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